Title: X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT and hard X-ray telescopes
Type: Article in proceedingsArticle in proceedings
Participant(s):
Forfatter:  Hussain, A.M.
Technical University of Denmark

Author:  Christensen, Finn Erland (Cwisno: 38282)
Technical University of Denmark
Email:

Forfatter:  Jimenez-Garate, M.A.
Technical University of Denmark

Forfatter:  Craig, W.W.
Technical University of Denmark

Forfatter:  Hailey, C.J.
Technical University of Denmark

Forfatter:  Decker, T.R.
Technical University of Denmark

Forfatter:  Stern, M.
Technical University of Denmark

Forfatter:  Windt, D.L.
Technical University of Denmark

Forfatter:  Mao, P.H.
Technical University of Denmark

Forfatter:  Harrison, F.A.
Technical University of Denmark

Forfatter:  Pareschi, G.
Technical University of Denmark

Forfatter:  del Rio, M.S.
Technical University of Denmark

Forfatter:  Souvorov, A.
Technical University of Denmark

Forfatter:  Freund, A.K.
Technical University of Denmark

Forfatter:  Tucoulou, R.
Technical University of Denmark

Forfatter:  Madsen, A.
Technical University of Denmark

Forfatter:  Mammen, C.
Technical University of Denmark
Published: part of: Proceedings of SPIE - The International Society for Optical Engineering, 1999,
Presented at: Proceedings of the 1999 X-Ray Optics, Instruments, and Missions II
See the publication in DTU Orbit See the publication in DTU Orbit