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Titel: JEM-X: The X-ray monitor on INTEGRAL
Type: Article in proceedingsArticle in proceedings
Person(er):
Forfatter:  Budtz-Jørgensen, Carl (Cwisno: 38278)
Technical University of Denmark
Email:

Forfatter:  Lund, Niels (Cwisno: 38305)
Technical University of Denmark
Email:

Forfatter:  Westergaard, Niels Jørgen Stenfeldt (Cwisno: 38304)
Technical University of Denmark
Email:

Forfatter:  Brandt, Søren (Cwisno: 38321)
Technical University of Denmark
Email:

Forfatter:  Hornstrup, Allan (Cwisno: 38273)
Technical University of Denmark
Email:

Forfatter:  Rasmussen, Ib Lundgaard (Cwisno: 38288)
Technical University of Denmark
Email:

Forfatter:  Laursen, Steen (Cwisno: 38317)
Technical University of Denmark

Forfatter:  Pedersen, S.M.
Technical University of Denmark

Forfatter:  Kristensen, R.E.
Technical University of Denmark

Forfatter:  Mogensen, P.B.
Technical University of Denmark

Forfatter:  Andersen, K.H.
Technical University of Denmark

Forfatter:  Rasmussen, Ib Lundgaard (Cwisno: 38288)
Technical University of Denmark
Email:

Forfatter:  Polny, Josef (Cwisno: 38292)
Technical University of Denmark
Email:

Forfatter:  Jensen, Poul Anker (Cwisno: 38312)
Technical University of Denmark
Email:

Forfatter:  Oxborrow, Carol Anne (Cwisno: 38279)
Technical University of Denmark
Email:

Forfatter:  Chenevez, Jérôme (Cwisno: 38290)
Technical University of Denmark
Email:

Forfatter:  Omoe, K.
Technical University of Denmark

Forfatter:  Kämäräinen, V.J.
Technical University of Denmark

Forfatter:  Andersson, Toke Bech (Cwisno: 38324)
Technical University of Denmark

Forfatter:  Vilhu, O.R.
Technical University of Denmark

Forfatter:  Huovelin, J.
Technical University of Denmark

Forfatter:  Costa, E.
Technical University of Denmark

Forfatter:  Feroci, M.
Technical University of Denmark

Forfatter:  Rubini, A.
Technical University of Denmark

Forfatter:  Morelli, E.
Technical University of Denmark

Forfatter:  Morbidini, A.
Technical University of Denmark

Forfatter:  Frontera, F.
Technical University of Denmark

Forfatter:  Pelliciari, C.
Technical University of Denmark

Forfatter:  Loffredo, G.
Technical University of Denmark

Forfatter:  Zavattini, G.
Technical University of Denmark

Forfatter:  Carassiti, V.
Technical University of Denmark

Forfatter:  Morawski, M.
Technical University of Denmark

Forfatter:  Juchnikowski, G.
Technical University of Denmark

Forfatter:  Reglero, V.
Technical University of Denmark

Forfatter:  Peris, J.
Technical University of Denmark

Forfatter:  Collado, V.
Technical University of Denmark

Forfatter:  Rodirgo, J.M.
Technical University of Denmark

Forfatter:  Perez, F.
Technical University of Denmark

Forfatter:  Requena, J.L.
Technical University of Denmark

Forfatter:  Larsson, S.
Technical University of Denmark

Forfatter:  Svensson, R.
Technical University of Denmark

Forfatter:  Zdziarski, A.
Technical University of Denmark

Forfatter:  Castro-Tirado, A.J.
Technical University of Denmark

Forfatter:  Schnopper, H.W.
Technical University of Denmark
Uddrag: The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6degrees FOV, FWHM).
Publiceret: part of: X-ray and Gamma-ray Instumentation for Astronomy XIII (ISBN: 0-8194-5038-3), pages: 139-150, 2004,
DOI:
Præsenteret ved: X-ray and Gamma-ray Instrumentation for Astronomy XIII, San Diego, CA
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